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Content-Length: 16220
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Date: Mon, 26 Jun 2017 19:15:12 GMT
ETag: "f603e5-3f5c-5512ce364d3c0"
Content-Type: text/html
HTTP/1.1 200 OK
Last-Modified: Mon, 05 Jun 2017 02:01:59 GMT
Server: Apache/2.2.11 (Unix) mod_ssl/2.2.11 OpenSSL/0.9.8e-fips-rhel5 PHP/5.2.9
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Other profiles | |
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Google Analytics ID: | 33657899-1 |
Known AddThis user account: | Information does not apply |
Google Adsense Publisher: | Information does not apply |
Google+ Identity: | Information does not apply |
Whois details | |
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Website Address renewal date: | 17/6/22 |
Domain Address Reg. date: | 05/7/26 |
Website address in use until: | 18/7/26 |
Unedited Whois Data: | |
Whois Server Version 2.0 Domain names in the .com and .net domains can now be registered with many different competing registrars. Go to http://www.internic.net for detailed information. Domain Name: JAWJAPAN.COM Registrar: GMO INTERNET, INC. DBA ONAMAE.COM Sponsoring Registrar IANA ID: 49 Whois Server: whois.discount-domain.com Referral URL: http://www.onamae.com/ Name Server: NS-1177.AWSDNS-19.ORG Name Server: NS-1808.AWSDNS-34.CO.UK Name Server: NS-388.AWSDNS-48.COM Name Server: NS-589.AWSDNS-09.NET Status: ok https://icann.org/epp#ok Updated Date: 22-jun-2017 Creation Date: 26-jul-2005 Expiration Date: 26-jul-2018 >>> Last update of whois database: 2017-07-20T06:09:25Z <<< For more information on Whois status codes, please visit https://icann.org/epp NOTICE: The expiration date displayed in this record is the date the registrar's sponsorship of the domain name registration in the registry is currently set to expire. This date does not necessarily reflect the expiration date of the domain name registrant's agreement with the sponsoring registrar. Users may consult the sponsoring registrar's Whois database to view the registrar's reported date of expiration for this registration. TERMS OF USE: You are not authorized to access or query our Whois database through the use of electronic processes that are high-volume and automated except as reasonably necessary to register domain names or modify existing registrations; the Data in VeriSign Global Registry Services' ("VeriSign") Whois database is provided by VeriSign for information purposes only, and to assist persons in obtaining information about or related to a domain name registration record. VeriSign does not guarantee its accuracy. By submitting a Whois query, you agree to abide by the following terms of use: You agree that you may use this Data only for lawful purposes and that under no circumstances will you use this Data to: (1) allow, enable, or otherwise support the transmission of mass unsolicited, commercial advertising or solicitations via e-mail, telephone, or facsimile; or (2) enable high volume, automated, electronic processes that apply to VeriSign (or its computer systems). The compilation, repackaging, dissemination or other use of this Data is expressly prohibited without the prior written consent of VeriSign. You agree not to use electronic processes that are automated and high-volume to access or query the Whois database except as reasonably necessary to register domain names or modify existing registrations. VeriSign reserves the right to restrict your access to the Whois database in its sole discretion to ensure operational stability. VeriSign may restrict or terminate your access to the Whois database for failure to abide by these terms of use. VeriSign reserves the right to modify these terms at any time. The Registry database contains ONLY .COM, .NET, .EDU domains and Registrars. Domain Name: jawjapan.com Registry Domain ID: 189041251_DOMAIN_COM-VRSN Registrar WHOIS Server: whois.discount-domain.com Registrar URL: http://www.onamae.com Updated Date: 2017-06-23T00:00:00Z Creation Date: 2005-07-26T00:00:00Z Registrar Registration Expiration Date: 2018-07-26T00:00:00Z Registrar: GMO INTERNET, INC. Registrar IANA ID: 49 Registrar Abuse Contact Email: No email disclosed Registrar Abuse Contact Phone: +81.337709199 Domain Status: ok https://icann.org/epp#ok Registry Registrant ID: Not Available From Registry Registrant Name: Koichi Tsutsumi Registrant Organization: Koichi Tsutsumi Registrant Street: 5-22-9 Ogikubo Registrant Street: Fuji 2F Registrant City: Suginami-ku Registrant State/Province: Tokyo Registrant Postal Code: 167-0051 Registrant Country: JP Registrant Phone: +81.332205871 Registrant Phone Ext: Registrant Fax: +81.332205876 Registrant Fax Ext: Registrant Email: No email disclosed Registry Admin ID: Not Available From Registry Admin Name: Koichi Tsutsumi Admin Organization: Koichi Tsutsumi Admin Street: 5-22-9 Ogikubo Admin Street: Fuji 2F Admin City: Suginami-ku Admin State/Province: Tokyo Admin Postal Code: 167-0051 Admin Country: JP Admin Phone: +81.332205871 Admin Phone Ext: Admin Fax: +81.332205876 Admin Fax Ext: Admin Email: No email disclosed Registry Tech ID: Not Available From Registry Tech Name: Kazunori Takamura Tech Organization: Itoh Co. Tech Street: 498-1 Minami-Nagaike Tech City: Nagano-City Tech State/Province: Nagano Tech Postal Code: 3810024 Tech Country: JP Tech Phone: +81.262215885 Tech Phone Ext: Tech Fax: +81.262214710 Tech Fax Ext: Tech Email: No email disclosed Name Server: ns-589.awsdns-09.net Name Server: ns-1177.awsdns-19.org Name Server: ns-388.awsdns-48.com Name Server: ns-1808.awsdns-34.co.uk DNSSEC: unsigned URL of the ICANN WHOIS Data Problem Reporting System: http://wdprs.internic.net/ >>> Last update of WHOIS database: 2017-06-23T00:00:00Z <<< For more information on Whois status codes, please visit https://icann.org/epp | |
Possible owner address: | |
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DNS information | ||
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US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819 | ns-388.awsdns-48.com | 205.251.193.132 |
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819 | ns-1177.awsdns-19.org | 205.251.196.153 |
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819 | ns-589.awsdns-09.net | 205.251.194.77 |
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819 | ns-1808.awsdns-34.co.uk | 205.251.199.16 |
What others say |
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Safety overview | |
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WOT Child Safety Rank: | Data unavailable |
WOT Safety Rank: | Data unavailable |
Google Safe assessment: | Data unavailable |
Relation to all content | Main tag words | Times search keyword used |
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Data unavailable | 分光エリプソメーター | Data unavailable |
Data unavailable | エリプソメトリー | Data unavailable |
Data unavailable | エリプソメーター | Data unavailable |
Data unavailable | 分光エリプソメトリ | Data unavailable |
Data unavailable | 反射防止 | Data unavailable |
Data unavailable | 屈折率 | Data unavailable |
Data unavailable | In Situ | Data unavailable |
Data unavailable | Multi-Wavelength Ellipsometer | Data unavailable |
Data unavailable | 誘電体 | Data unavailable |
Data unavailable | J A Woollam | Data unavailable |
Data unavailable | 化合物半導体 | Data unavailable |
Data unavailable | 分光エリプソ | Data unavailable |
Data unavailable | コーティング | Data unavailable |
Data unavailable | 薄膜 | Data unavailable |
Data unavailable | 分光エリプソメータ | Data unavailable |
Data unavailable | Ex-Situ | Data unavailable |
Data unavailable | 偏光 | Data unavailable |
Data unavailable | 非接触 | Data unavailable |
Data unavailable | 有機膜 | Data unavailable |
Data unavailable | 合金 | Data unavailable |
Data unavailable | 解析ソフトウェア | Data unavailable |
Data unavailable | ジェー・エー・ウーラム・ジャパン | Data unavailable |
Data unavailable | 自動多入射角分光エリプソメーター | Data unavailable |
Data unavailable | エリプソ | Data unavailable |
Data unavailable | 組成 | Data unavailable |
Data unavailable | 表面 | Data unavailable |
Data unavailable | 膜厚 | Data unavailable |
Data unavailable | 分光エリプソメトリー | Data unavailable |
Data unavailable | エリプソメータ | Data unavailable |
Data unavailable | 界面 | Data unavailable |
Data unavailable | 結晶度 | Data unavailable |
Data unavailable | エリプソメトリ | Data unavailable |
Data unavailable | VASE | Data unavailable |
Data unavailable | 非破壊 | Data unavailable |
Data unavailable | 吸収係数 | Data unavailable |
Data unavailable | エリプソメトリーデータ | Data unavailable |
Data unavailable | Spectroscopic | Data unavailable |
Data unavailable | ジェーエーウーラムジャパン | Data unavailable |
Data unavailable | Ellipsometry | Data unavailable |
Data unavailable | バルク | Data unavailable |
Data unavailable | 高速多波長エリプソメーター | Data unavailable |
Data unavailable | M-44/M-88 | Data unavailable |
Data unavailable | WVASE | Data unavailable |
Data unavailable | VASE | Data unavailable |
Data unavailable | 光学定数 | Data unavailable |
Data unavailable | Ex Situ | Data unavailable |
Data unavailable | woollam | Data unavailable |
Data unavailable | 分析受託サービス | Data unavailable |
Data unavailable | In-Situ | Data unavailable |
Data unavailable | J.A.Woollam | Data unavailable |
Data unavailable | 半導体 | Data unavailable |
Data unavailable | Variable Angle Spectroscopic Ellipsometers | Data unavailable |
Data unavailable | 異方性測定 | Data unavailable |
Data unavailable | 透過率 | Data unavailable |
Data unavailable | 重合体 | Data unavailable |
Data unavailable | ミューラー行列 | Data unavailable |
Data unavailable | 多層膜 | Data unavailable |
Data unavailable | resistivity | Data unavailable |
Data unavailable | M-2000R | Data unavailable |
Data unavailable | ディスプレイ産業用 | Data unavailable |
Data unavailable | 不透明な基板 | Data unavailable |
Data unavailable | スパッタリング | Data unavailable |
Data unavailable | MBE | Data unavailable |
Data unavailable | 反射率 | Data unavailable |
Data unavailable | In-Situプロセスモニタリング | Data unavailable |
Data unavailable | ドーピングプロファイル | Data unavailable |
Data unavailable | 偏光解消率 | Data unavailable |
Data unavailable | In-Situ用のエリプソメーター | Data unavailable |
Data unavailable | 抵抗率測定 | Data unavailable |
Data unavailable | M-2000 | Data unavailable |
Data unavailable | アニーリングエッチング | Data unavailable |
Data unavailable | E-beam 蒸発 | Data unavailable |
Data unavailable | ウェハー面内分布測定 | Data unavailable |
Data unavailable | Analysis Software for Ellipsometry and Spectrophotometry WVASE | Data unavailable |
Data unavailable | AutoRetarder | Data unavailable |
Data unavailable | 消衰係数 | Data unavailable |
Data unavailable | 成膜 | Data unavailable |
Data unavailable | FTIR | Data unavailable |
Data unavailable | PVD | Data unavailable |
Data unavailable | スキャッタメトリー | Data unavailable |
Data unavailable | 誘電体 | Data unavailable |
Data unavailable | エッチング | Data unavailable |
Data unavailable | CVD | Data unavailable |
Data unavailable | 金属 | Data unavailable |
Data unavailable | Flatpanel | Data unavailable |
Data unavailable | 高速分光エリプソメーター | Data unavailable |
Data unavailable | measurements | Data unavailable |
Data unavailable | フォトマスク | Data unavailable |
Data unavailable | EPI膜厚 | Data unavailable |
Data unavailable | ε1 | Data unavailable |
Data unavailable | ポリマー解析 | Data unavailable |
Data unavailable | EPI-lay thickness | Data unavailable |
Data unavailable | VUV-VASER | Data unavailable |
Data unavailable | 真空紫外域のエリプソメーター | Data unavailable |
Data unavailable | IR-VASER | Data unavailable |
Data unavailable | サンプルヒートステージ | Data unavailable |
Data unavailable | doping profiles | Data unavailable |
Data unavailable | In Situ分光エリプソメーター | Data unavailable |
Data unavailable | ε2 | Data unavailable |
Data unavailable | 赤外域多入射角分光エリプソメータ | Data unavailable |
Data unavailable | 回転補償子型エリプソメーター | Data unavailable |
Data unavailable | 電気化学 | Data unavailable |
Data unavailable | 超薄膜 | Data unavailable |
Data unavailable | FPM-2000 | Data unavailable |
Data unavailable | 透過強度データ | Data unavailable |
Data unavailable | 近赤外域測定 | Data unavailable |
Data unavailable | 光学定数の測定 | Data unavailable |
Data unavailable | バルクガラス | Data unavailable |
Data unavailable | ellipsometer | Data unavailable |
Data unavailable | インジウムスズ酸化膜 | Data unavailable |
Data unavailable | VASE | Data unavailable |
Data unavailable | focused beam ellipsometry | Data unavailable |
Data unavailable | ellipsometry | Data unavailable |
Data unavailable | IR-VASE | Data unavailable |
Data unavailable | Wollam | Data unavailable |
Data unavailable | 集光ビームによる測定 | Data unavailable |
Data unavailable | spectroscopic ellipsometer | Data unavailable |
Data unavailable | 透明導電酸化物 | Data unavailable |
Data unavailable | 面内の膜厚分布測定 | Data unavailable |
Data unavailable | multiwavelength ellipsometer | Data unavailable |
Data unavailable | 反射防止膜 | Data unavailable |
Data unavailable | ellipsometers | Data unavailable |
Data unavailable | infrared ellipsometry | Data unavailable |
Data unavailable | J. A. Woollam | Data unavailable |
Data unavailable | Langmuir-Blodgett膜 | Data unavailable |
Data unavailable | フラットパネルディスプレイ | Data unavailable |
Data unavailable | 薄い誘電体の表面層 | Data unavailable |
Data unavailable | 薄膜サンプル測定サービス | Data unavailable |
Data unavailable | real time | Data unavailable |
Data unavailable | SnO2 | Data unavailable |
Data unavailable | rotating compensator ellipsometer | Data unavailable |
Data unavailable | 半導体基板 | Data unavailable |
Data unavailable | 薄膜試料の膜厚 | Data unavailable |
Data unavailable | Woollam | Data unavailable |
Data unavailable | Woolam | Data unavailable |
Data unavailable | バルク試料の光学定数の測定 | Data unavailable |
Data unavailable | metrology | Data unavailable |
Data unavailable | spectroscopic ellipsometry | Data unavailable |
Data unavailable | ITO | Data unavailable |
Data unavailable | 多層膜有機膜 | Data unavailable |
Data unavailable | ARC | Data unavailable |
Data unavailable | 非破壊材料分析 | Data unavailable |
Data unavailable | フォトレジスト | Data unavailable |
Data unavailable | TCO | Data unavailable |
Data unavailable | 表面粗さ | Data unavailable |
Data unavailable | 金属膜 | Data unavailable |
Data unavailable | 異方性膜 | Data unavailable |
Data unavailable | 自然酸化膜 | Data unavailable |
Data unavailable | ZnO | Data unavailable |
Data unavailable | insitu | Data unavailable |
Data unavailable | 測定解析ラボ | Data unavailable |
Data unavailable | リソグラフィー分野 | Data unavailable |
Data unavailable | SE | Data unavailable |
Data unavailable | infrared ellipsometer | Data unavailable |
Data unavailable | 化合物半導体 | Data unavailable |
Data unavailable | WVASE32 | Data unavailable |
Data unavailable | optical properties | Data unavailable |
Data unavailable | optical constants | Data unavailable |
Data unavailable | thin film thickness | Data unavailable |
Data unavailable | index of refraction | Data unavailable |
Data unavailable | birefringence | Data unavailable |
Data unavailable | retardance | Data unavailable |
Data unavailable | instrumentation | Data unavailable |
Alexa ranking information | |
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Past year global rank trend | |
Last Alexa data update: | 18/6/1 |
Ranking delta: | +828 030 |
Country ranking: | Data unavailable |
Links | |
Information does not apply | |
One month trend average stats | |
Global/International rating: | 105 102 |
Target Country: | Data unavailable |
Position based on reach: | Data unavailable |
Detailed index page overview | |
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Top external pages linked to | |
IP of the host server: | 220.110.184.150 |
Physical server location: | Data unavailable |