Site-Overview.com
Site-Overview.com : Domain list : 2 : 26 : 265 : 2654 : 26547 : 265476
Accurate Jawjapan.com performance statistics for beginners and professionals alike:
Website meta caption: ジェー・エー・ウーラム・ジャパン - Home
Analysis in a nutshell: We also want to add that the Alexa Global position for jawjapan.com has changed by +828 030 over the past 3 months. The homepage contains 3 off-bound links. Server used for this website is located in Data unavailable. Date of registry for this domain: 05/7/26. Domain registration updated on: 17/6/22. Date of expiration: 18/7/26. jawjapan.com Alexa ranking is, at this time, at 105 102.
Website summary: J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR. 240
HTTP Information:
Content-Length: 16220 Accept-Ranges: bytes Date: Mon, 26 Jun 2017 19:15:12 GMT ETag: "f603e5-3f5c-5512ce364d3c0" Content-Type: text/html HTTP/1.1 200 OK Last-Modified: Mon, 05 Jun 2017 02:01:59 GMT Server: Apache/2.2.11 (Unix) mod_ssl/2.2.11 OpenSSL/0.9.8e-fips-rhel5 PHP/5.2.9
Other profiles
Google Analytics ID:33657899-1
Known AddThis user account:Information does not apply
Google Adsense Publisher:Information does not apply
Google+ Identity:Information does not apply
Whois details
Website Address renewal date:17/6/22
Domain Address Reg. date:05/7/26
Website address in use until:18/7/26
Unedited Whois Data:

Whois Server Version 2.0 Domain names in the .com and .net domains can now be registered with many different competing registrars. Go to http://www.internic.net for detailed information. Domain Name: JAWJAPAN.COM Registrar: GMO INTERNET, INC. DBA ONAMAE.COM Sponsoring Registrar IANA ID: 49 Whois Server: whois.discount-domain.com Referral URL: http://www.onamae.com/ Name Server: NS-1177.AWSDNS-19.ORG Name Server: NS-1808.AWSDNS-34.CO.UK Name Server: NS-388.AWSDNS-48.COM Name Server: NS-589.AWSDNS-09.NET Status: ok https://icann.org/epp#ok Updated Date: 22-jun-2017 Creation Date: 26-jul-2005 Expiration Date: 26-jul-2018 >>> Last update of whois database: 2017-07-20T06:09:25Z <<< For more information on Whois status codes, please visit https://icann.org/epp NOTICE: The expiration date displayed in this record is the date the registrar's sponsorship of the domain name registration in the registry is currently set to expire. This date does not necessarily reflect the expiration date of the domain name registrant's agreement with the sponsoring registrar. Users may consult the sponsoring registrar's Whois database to view the registrar's reported date of expiration for this registration. TERMS OF USE: You are not authorized to access or query our Whois database through the use of electronic processes that are high-volume and automated except as reasonably necessary to register domain names or modify existing registrations; the Data in VeriSign Global Registry Services' ("VeriSign") Whois database is provided by VeriSign for information purposes only, and to assist persons in obtaining information about or related to a domain name registration record. VeriSign does not guarantee its accuracy. By submitting a Whois query, you agree to abide by the following terms of use: You agree that you may use this Data only for lawful purposes and that under no circumstances will you use this Data to: (1) allow, enable, or otherwise support the transmission of mass unsolicited, commercial advertising or solicitations via e-mail, telephone, or facsimile; or (2) enable high volume, automated, electronic processes that apply to VeriSign (or its computer systems). The compilation, repackaging, dissemination or other use of this Data is expressly prohibited without the prior written consent of VeriSign. You agree not to use electronic processes that are automated and high-volume to access or query the Whois database except as reasonably necessary to register domain names or modify existing registrations. VeriSign reserves the right to restrict your access to the Whois database in its sole discretion to ensure operational stability. VeriSign may restrict or terminate your access to the Whois database for failure to abide by these terms of use. VeriSign reserves the right to modify these terms at any time. The Registry database contains ONLY .COM, .NET, .EDU domains and Registrars. Domain Name: jawjapan.com Registry Domain ID: 189041251_DOMAIN_COM-VRSN Registrar WHOIS Server: whois.discount-domain.com Registrar URL: http://www.onamae.com Updated Date: 2017-06-23T00:00:00Z Creation Date: 2005-07-26T00:00:00Z Registrar Registration Expiration Date: 2018-07-26T00:00:00Z Registrar: GMO INTERNET, INC. Registrar IANA ID: 49 Registrar Abuse Contact Email: No email disclosed Registrar Abuse Contact Phone: +81.337709199 Domain Status: ok https://icann.org/epp#ok Registry Registrant ID: Not Available From Registry Registrant Name: Koichi Tsutsumi Registrant Organization: Koichi Tsutsumi Registrant Street: 5-22-9 Ogikubo Registrant Street: Fuji 2F Registrant City: Suginami-ku Registrant State/Province: Tokyo Registrant Postal Code: 167-0051 Registrant Country: JP Registrant Phone: +81.332205871 Registrant Phone Ext: Registrant Fax: +81.332205876 Registrant Fax Ext: Registrant Email: No email disclosed Registry Admin ID: Not Available From Registry Admin Name: Koichi Tsutsumi Admin Organization: Koichi Tsutsumi Admin Street: 5-22-9 Ogikubo Admin Street: Fuji 2F Admin City: Suginami-ku Admin State/Province: Tokyo Admin Postal Code: 167-0051 Admin Country: JP Admin Phone: +81.332205871 Admin Phone Ext: Admin Fax: +81.332205876 Admin Fax Ext: Admin Email: No email disclosed Registry Tech ID: Not Available From Registry Tech Name: Kazunori Takamura Tech Organization: Itoh Co. Tech Street: 498-1 Minami-Nagaike Tech City: Nagano-City Tech State/Province: Nagano Tech Postal Code: 3810024 Tech Country: JP Tech Phone: +81.262215885 Tech Phone Ext: Tech Fax: +81.262214710 Tech Fax Ext: Tech Email: No email disclosed Name Server: ns-589.awsdns-09.net Name Server: ns-1177.awsdns-19.org Name Server: ns-388.awsdns-48.com Name Server: ns-1808.awsdns-34.co.uk DNSSEC: unsigned URL of the ICANN WHOIS Data Problem Reporting System: http://wdprs.internic.net/ >>> Last update of WHOIS database: 2017-06-23T00:00:00Z <<< For more information on Whois status codes, please visit https://icann.org/epp

Possible owner address:
  1. fuji 2f
  2. 5-22-9 ogikubo
Domain owner:
Contact phone number:
  1. +81.337709199
DNS information
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819ns-388.awsdns-48.com205.251.193.132
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819ns-1177.awsdns-19.org205.251.196.153
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819ns-589.awsdns-09.net205.251.194.77
US; United States; WA; Washington; Seattle; 98101; America/Los_Angeles; 47.61030000; -122.33410000; 819ns-1808.awsdns-34.co.uk205.251.199.16
What others say
Safety overview
WOT Child Safety Rank:Data unavailable
WOT Safety Rank:Data unavailable
Google Safe assessment:Data unavailable
Relation to all contentMain tag wordsTimes search keyword used
Data unavailable分光エリプソメーターData unavailable
Data unavailableエリプソメトリーData unavailable
Data unavailableエリプソメーターData unavailable
Data unavailable分光エリプソメトリData unavailable
Data unavailable反射防止Data unavailable
Data unavailable屈折率Data unavailable
Data unavailableIn SituData unavailable
Data unavailableMulti-Wavelength EllipsometerData unavailable
Data unavailable誘電体Data unavailable
Data unavailableJ A WoollamData unavailable
Data unavailable化合物半導体Data unavailable
Data unavailable分光エリプソData unavailable
Data unavailableコーティングData unavailable
Data unavailable薄膜Data unavailable
Data unavailable分光エリプソメータData unavailable
Data unavailableEx-SituData unavailable
Data unavailable偏光Data unavailable
Data unavailable非接触Data unavailable
Data unavailable有機膜Data unavailable
Data unavailable合金Data unavailable
Data unavailable解析ソフトウェアData unavailable
Data unavailableジェー・エー・ウーラム・ジャパンData unavailable
Data unavailable自動多入射角分光エリプソメーターData unavailable
Data unavailableエリプソData unavailable
Data unavailable組成Data unavailable
Data unavailable表面Data unavailable
Data unavailable膜厚Data unavailable
Data unavailable分光エリプソメトリーData unavailable
Data unavailableエリプソメータData unavailable
Data unavailable界面Data unavailable
Data unavailable結晶度Data unavailable
Data unavailableエリプソメトリData unavailable
Data unavailableVASEData unavailable
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Data unavailable吸収係数Data unavailable
Data unavailableエリプソメトリーデータData unavailable
Data unavailableSpectroscopicData unavailable
Data unavailableジェーエーウーラムジャパンData unavailable
Data unavailableEllipsometryData unavailable
Data unavailableバルクData unavailable
Data unavailable高速多波長エリプソメーターData unavailable
Data unavailableM-44/M-88Data unavailable
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Data unavailableVASEData unavailable
Data unavailable光学定数Data unavailable
Data unavailableEx SituData unavailable
Data unavailablewoollamData unavailable
Data unavailable分析受託サービスData unavailable
Data unavailableIn-SituData unavailable
Data unavailableJ.A.WoollamData unavailable
Data unavailable半導体Data unavailable
Data unavailableVariable Angle Spectroscopic EllipsometersData unavailable
Data unavailable異方性測定Data unavailable
Data unavailable透過率Data unavailable
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Data unavailableミューラー行列Data unavailable
Data unavailable多層膜Data unavailable
Data unavailableresistivityData unavailable
Data unavailableM-2000RData unavailable
Data unavailableディスプレイ産業用Data unavailable
Data unavailable不透明な基板Data unavailable
Data unavailableスパッタリングData unavailable
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Data unavailable反射率Data unavailable
Data unavailableIn-SituプロセスモニタリングData unavailable
Data unavailableドーピングプロファイルData unavailable
Data unavailable偏光解消率Data unavailable
Data unavailableIn-Situ用のエリプソメーターData unavailable
Data unavailable抵抗率測定Data unavailable
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Data unavailableアニーリングエッチングData unavailable
Data unavailableE-beam 蒸発Data unavailable
Data unavailableウェハー面内分布測定Data unavailable
Data unavailableAnalysis Software for Ellipsometry and Spectrophotometry WVASEData unavailable
Data unavailableAutoRetarderData unavailable
Data unavailable消衰係数Data unavailable
Data unavailable成膜Data unavailable
Data unavailableFTIRData unavailable
Data unavailablePVDData unavailable
Data unavailableスキャッタメトリーData unavailable
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Data unavailable高速分光エリプソメーターData unavailable
Data unavailablemeasurementsData unavailable
Data unavailableフォトマスクData unavailable
Data unavailableEPI膜厚Data unavailable
Data unavailableε1Data unavailable
Data unavailableポリマー解析Data unavailable
Data unavailableEPI-lay thicknessData unavailable
Data unavailableVUV-VASERData unavailable
Data unavailable真空紫外域のエリプソメーターData unavailable
Data unavailableIR-VASERData unavailable
Data unavailableサンプルヒートステージData unavailable
Data unavailabledoping profilesData unavailable
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Data unavailable赤外域多入射角分光エリプソメータData unavailable
Data unavailable回転補償子型エリプソメーターData unavailable
Data unavailable電気化学Data unavailable
Data unavailable超薄膜Data unavailable
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Data unavailable透過強度データData unavailable
Data unavailable近赤外域測定Data unavailable
Data unavailable光学定数の測定Data unavailable
Data unavailableバルクガラスData unavailable
Data unavailableellipsometerData unavailable
Data unavailableインジウムスズ酸化膜Data unavailable
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Data unavailablefocused beam ellipsometryData unavailable
Data unavailableellipsometryData unavailable
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Data unavailableWollamData unavailable
Data unavailable集光ビームによる測定Data unavailable
Data unavailablespectroscopic ellipsometerData unavailable
Data unavailable透明導電酸化物Data unavailable
Data unavailable面内の膜厚分布測定Data unavailable
Data unavailablemultiwavelength ellipsometerData unavailable
Data unavailable反射防止膜Data unavailable
Data unavailableellipsometersData unavailable
Data unavailableinfrared ellipsometryData unavailable
Data unavailableJ. A. WoollamData unavailable
Data unavailableLangmuir-Blodgett膜Data unavailable
Data unavailableフラットパネルディスプレイData unavailable
Data unavailable薄い誘電体の表面層Data unavailable
Data unavailable薄膜サンプル測定サービスData unavailable
Data unavailablereal timeData unavailable
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Data unavailablerotating compensator ellipsometerData unavailable
Data unavailable半導体基板Data unavailable
Data unavailable薄膜試料の膜厚Data unavailable
Data unavailableWoollamData unavailable
Data unavailableWoolamData unavailable
Data unavailableバルク試料の光学定数の測定Data unavailable
Data unavailablemetrologyData unavailable
Data unavailablespectroscopic ellipsometryData unavailable
Data unavailableITOData unavailable
Data unavailable多層膜有機膜Data unavailable
Data unavailableARCData unavailable
Data unavailable非破壊材料分析Data unavailable
Data unavailableフォトレジストData unavailable
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Data unavailable自然酸化膜Data unavailable
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Data unavailableinfrared ellipsometerData unavailable
Data unavailable化合物半導体Data unavailable
Data unavailableWVASE32Data unavailable
Data unavailableoptical propertiesData unavailable
Data unavailableoptical constantsData unavailable
Data unavailablethin film thicknessData unavailable
Data unavailableindex of refractionData unavailable
Data unavailablebirefringenceData unavailable
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Alexa ranking information
Past year global rank trend
Last Alexa data update:18/6/1
Ranking delta:+828 030
Country ranking:Data unavailable
Links
Information does not apply
One month trend average stats
Global/International rating:105 102
Target Country:Data unavailable
Position based on reach:Data unavailable
Detailed index page overview
Top external pages linked to
IP of the host server:220.110.184.150
Physical server location:Data unavailable
Other overviews
2024-05-03 04:13:20 ... 0.0248